发明名称 METHOD FOR MEASURING LATTICE CONSTANT OF SINGLE CRYSTAL
摘要 PROBLEM TO BE SOLVED: To provide a method by which the lattice constant of a single crystal can be measured accurately and quickly. SOLUTION: In a method for measuring lattice constant of single crystal, the lattice constant of a single crystal is measured by using a bond method in such a way that the range of angle to be measured is decided from the measured result of the peak profile of diffracted X rays to a specific lattice plane when the peak profile is measured at and after the second time in the case the peak profile is measured a plurality of times for accurately finding the lattice constant of the single crystal by X-ray diffraction.
申请公布号 JPH0980001(A) 申请公布日期 1997.03.28
申请号 JP19950237186 申请日期 1995.09.14
申请人 TOSHIBA CORP 发明人 OMORI HIROFUMI;MATSUNAGA HIDEKI
分类号 G01N23/20 主分类号 G01N23/20
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