发明名称 |
RESIST REMOVING METHOD AND RESIST STRIPPING SOLUTION |
摘要 |
PROBLEM TO BE SOLVED: To attain high precision resist removal by dissolving the resist applied on a substrate with a stripping agent and cleaning the substrate with a supercritical fluid soluble in the resist and stripping solution. SOLUTION: A material A to be cleaned (semiconductor substrate) to which the resist is stuck is dipped into the stripping solution 1 of diethylene glycol monomethyl ether heated at 40 deg.C, which is filled in a stripping vessel 2 for 2-3min. In this way, the resist applied on the material A to be cleaned is dissolved. Next, the material A to be cleaned after the resist is dissolved by the stripping solution is housed in a pressure resistant rinse vessel 3 before the vessel 3 is hermetically closed. And the material A to be cleaned is cleaned for 3min while pouring the supercritical carbon dioxide 4. After the cleaning with the supercritical carbon dioxide 4 is completed, the cover 3a of the rinse vessel 3 is opened to leave the inside of the rinse vessel 3 to ordinary temp. and pressure. Then the material A to be cleaned is dried without generating stain since the supercritical carbon dioxide 4 is instantly gasified and vaporized. |
申请公布号 |
JPH0943857(A) |
申请公布日期 |
1997.02.14 |
申请号 |
JP19950190352 |
申请日期 |
1995.07.26 |
申请人 |
SHARP CORP;TOHO CHEM IND CO LTD |
发明人 |
MINAMIHOUNOKI TAKASHI;MATSUZAKI TAKETAKA |
分类号 |
G03F7/32;G03F7/42;H01L21/027;H01L21/304;(IPC1-7):G03F7/42 |
主分类号 |
G03F7/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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