发明名称 |
SEMICONDUCTOR MANUFACTURING DEVICE AND MANUFACTURING METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To realize a semiconductor manufacturing device which can perform a plurality of treatments by one unit and can manufacture semiconductor elements with high quality during a film forming step. SOLUTION: A voltage is impressed between a semiconductor wafer 1 placed on the upper surface of a dielectric insulating layer 2 and an electrode plate 4 provided on the lower surface of the dielectric insulating layer 2 by a direct current power source. Then the wafer 1 is sucked and supporting on a wafer supporting face 3 of an upper surface of the dielectric insulating layer 2 caused by electrostatic attracting force generating. Plasma is generated in a plasma region 16 to perform sputtering by a treatment gas such as Ar being introduced into a treatment chamber 17 and a high frequency voltage being impressed to a counter electrode 14 by a high frequency power source 15. In the semiconductor manufacturing device being constituted of the above, the dielectric insulating layer 2 is adjusted as its voltage resistivityρbeing in a range of 10<8>Ωcm<ρ<10<13>Ωcm at the temperature where film making is practically performed.</p> |
申请公布号 |
JPH0945756(A) |
申请公布日期 |
1997.02.14 |
申请号 |
JP19950189990 |
申请日期 |
1995.07.26 |
申请人 |
HITACHI LTD |
发明人 |
KITSUNAI HIROYUKI;MORIAI IKUYO;SHIDA HIROYUKI |
分类号 |
C30B25/12;C23C14/50;H01L21/203;H01L21/205;H01L21/22;H01L21/302;H01L21/3065;H01L21/68;H01L21/683;(IPC1-7):H01L21/68;H01L21/306 |
主分类号 |
C30B25/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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