EVALUATING METHOD FOR RELIABILITY OF NON-VOLATILE SEMICONDUCTOR MEMORY AND NON-VOLATILE SEMICONDUCTOR DEVICE,申请号JP19950173668-传众专利搜索

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发明名称	EVALUATING METHOD FOR RELIABILITY OF NON-VOLATILE SEMICONDUCTOR MEMORY AND NON-VOLATILE SEMICONDUCTOR DEVICE
摘要
申请公布号	JPH0927198(A)	申请公布日期	1997.01.28
申请号	JP19950173668	申请日期	1995.07.10
申请人	MITSUBISHI ELECTRIC CORP	发明人	AJIKA NATSUO
分类号	H01L21/66;G11C29/00;G11C29/56;H01L21/8247;H01L29/788;H01L29/792;(IPC1-7):G11C29/00;H01L21/824	主分类号	H01L21/66
代理机构		代理人
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