发明名称 |
Method of making In-containing III/V semiconductor devices |
摘要 |
<p>A semiconductor device comprising In-contg. III-V material is mfd. by: (a) placing a body of the In-contg. III-V material in a reactor chamber; and (b) flowing a gas mixt. of N2 and BCl3 into the chamber and applying microwave power to the gas to form a plasma to remove some of the semiconductor material. The N2/BCl3 ratio is such that the etch rate of the material is at least 50% larger than the etch rate when the ratio is zero, all else being equal.</p> |
申请公布号 |
EP0755069(A1) |
申请公布日期 |
1997.01.22 |
申请号 |
EP19960305099 |
申请日期 |
1996.07.10 |
申请人 |
AT&T IPM CORP. |
发明人 |
HOBSON, WILLIAM SCOTT;REN, FAN;LOPATA, JOHN |
分类号 |
H01L29/73;H01L21/302;H01L21/306;H01L21/3065;H01L21/331;H01L21/338;H01L29/737;H01L29/778;H01L29/812;H01S5/00;(IPC1-7):H01L21/306 |
主分类号 |
H01L29/73 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|