发明名称 Mask for transferring a pattern for use in a semiconductor device and method for manufacturing the same.
摘要 A mask for transferring a pattern in which durability can be improved and a very fine circuit pattern of a light-shielding film can be formed, and a manufacturing method thereof are obtained. In the mask for transferring a pattern, a silicon monocrystalline film (2), an aluminum monocrystalline film (3) and an aluminum oxide film (4) are formed on a mask substrate (1) so as to have a prescribed pattern feature. Silicon monocrystalline film (2) and aluminum monocrystalline film (3) serve as the light-shielding film. Aluminum oxide film (4) serves as an anti reflection and protection film. <IMAGE>
申请公布号 EP0660183(A3) 申请公布日期 1997.01.02
申请号 EP19940115492 申请日期 1994.09.30
申请人 RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION;MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 SAKATA, HIROFUMI;NISHIOKA, TADASHI
分类号 G01Q30/12;G03F1/00;G03F1/46;G03F1/48;G03F1/54;G03F1/58;G03F1/68;H01L21/027 主分类号 G01Q30/12
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