发明名称 |
Mask for transferring a pattern for use in a semiconductor device and method for manufacturing the same. |
摘要 |
A mask for transferring a pattern in which durability can be improved and a very fine circuit pattern of a light-shielding film can be formed, and a manufacturing method thereof are obtained. In the mask for transferring a pattern, a silicon monocrystalline film (2), an aluminum monocrystalline film (3) and an aluminum oxide film (4) are formed on a mask substrate (1) so as to have a prescribed pattern feature. Silicon monocrystalline film (2) and aluminum monocrystalline film (3) serve as the light-shielding film. Aluminum oxide film (4) serves as an anti reflection and protection film. <IMAGE> |
申请公布号 |
EP0660183(A3) |
申请公布日期 |
1997.01.02 |
申请号 |
EP19940115492 |
申请日期 |
1994.09.30 |
申请人 |
RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION;MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
SAKATA, HIROFUMI;NISHIOKA, TADASHI |
分类号 |
G01Q30/12;G03F1/00;G03F1/46;G03F1/48;G03F1/54;G03F1/58;G03F1/68;H01L21/027 |
主分类号 |
G01Q30/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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