发明名称 MOS transistor fabrication method for high performance semiconductor device
摘要 The method for fabricating a MOS transistor includes forming an oxide layer over the surface of a substrate which is then etched to generate a clean semiconductor surface. A high quality gate oxide (40) is formed by e.g. heating the silicon substrate in oxygen atmosphere for a determined time interval. A polycrystalline silicon layer (6) with conductor properties is then formed on top of the gate. A mask (8) and a resin layer cover the polycrystalline silicon. A photolithography process is applied to the resin surface in order to obtain a surface pattern which include active (12) and field (10) regions. An insulating layer of silicon oxide is formed on the structure surface while a photolithography process defines buried n and p regions generated by ion implantation.
申请公布号 FR2735906(A1) 申请公布日期 1996.12.27
申请号 FR19950007675 申请日期 1995.06.21
申请人 SGS THOMSON MICROELECTRONICS SA 发明人 GAYET PHILIPPE
分类号 H01L21/28;H01L21/336;H01L21/762 主分类号 H01L21/28
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