发明名称 |
MOS transistor fabrication method for high performance semiconductor device |
摘要 |
The method for fabricating a MOS transistor includes forming an oxide layer over the surface of a substrate which is then etched to generate a clean semiconductor surface. A high quality gate oxide (40) is formed by e.g. heating the silicon substrate in oxygen atmosphere for a determined time interval. A polycrystalline silicon layer (6) with conductor properties is then formed on top of the gate. A mask (8) and a resin layer cover the polycrystalline silicon. A photolithography process is applied to the resin surface in order to obtain a surface pattern which include active (12) and field (10) regions. An insulating layer of silicon oxide is formed on the structure surface while a photolithography process defines buried n and p regions generated by ion implantation. |
申请公布号 |
FR2735906(A1) |
申请公布日期 |
1996.12.27 |
申请号 |
FR19950007675 |
申请日期 |
1995.06.21 |
申请人 |
SGS THOMSON MICROELECTRONICS SA |
发明人 |
GAYET PHILIPPE |
分类号 |
H01L21/28;H01L21/336;H01L21/762 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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