发明名称 Fault diagnosis device
摘要 A fault diagnosis device searches for causes of fault of a device under test via a fault tree having a tree structure corresponding to the hardware organization of the device under test, where the nodes of the fault tree correspond to the units of the device under test. Some of the nodes including the root node have three or more child nodes. A test table associated with each node other than a leaf includes: a description of parameters to be detected by detector units; test conditions with respect to the parameters detected by the detector units; and fault probability table representing the fault probability values and the child node names corresponding to the respective patterns of results of the tests. The whole fault tree may be divided into a main fault tree stored in the main memory and fault branch trees stored in auxiliary memory. Then, the fault branch trees are loaded into the main memory when needed.
申请公布号 US5587930(A) 申请公布日期 1996.12.24
申请号 US19910739591 申请日期 1991.07.24
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 HORI, SATOSHI;OMORI, TERUYO;SAKAGAMI, MAKOTO
分类号 G01D21/00;G01M99/00;G06F9/44;G06N5/04;G07C3/00;(IPC1-7):G01B7/00 主分类号 G01D21/00
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