发明名称 METHOD AND APPARATUS FOR FINELY PROCESSING TEFLON
摘要 PURPOSE: To finely process Teflon having high aspect ratio and easily processing with a large area by heating the surface of the Teflon of an object to be processed, and applying ultraviolet radiation having a specific wavelength to the surface of the object to be processed via a mask. CONSTITUTION: Radiated light 2 including ultraviolet radiation having a wavelength of 160nm is emitted from the electron locus 1 stored in a synchrotron along an optical axis 5. An object 4 to be processed is disposed at the position of a distance L from a light source along the axis 5. A mask 3 is disposed at a gap G forward of the object 4 to be processed. An area for substantially transmitting the light and an area for not transmitting it are formed on the surface of the mask 3. The light 2 is directed to the object to be processed via the mask 3. An ablation of the light 2 occurs on the surface of the object 4 to be processed, and the part emitted with the light 2 is released. A fine pattern is formed on the mask 3 to finely process the object 4 to be processed.
申请公布号 JPH08336894(A) 申请公布日期 1996.12.24
申请号 JP19950146127 申请日期 1995.06.13
申请人 SUMITOMO HEAVY IND LTD 发明人 KATO TAKANORI;CHIYOU ENHEI
分类号 C08J7/00;B29C59/16;B29K27/12;B81C99/00;C08L27/12;C08L57/00;(IPC1-7):B29C59/16 主分类号 C08J7/00
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