发明名称 |
STORAGE ELECTRODE MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
depositing a photoresist(8) for silylatione after forming a MOS transistor, an insulating layer(2) and a polysilicone layer(4) for a storage electrode contacted to a substrate(20); silylation of injecting silicone to the exposed region of the photoresist(8); forming a photoresist pattern(10) in order to roughen the side wall of the photoresist pattern(10) by etching the not-silylated photoresist by generating O2-based plasma; and forming a storage electrode(4) by etching the exposed polysilicone layer(4), and removing the photoresist pattern(10).
|
申请公布号 |
KR960015496(B1) |
申请公布日期 |
1996.11.14 |
申请号 |
KR19930016592 |
申请日期 |
1993.08.25 |
申请人 |
HYUNDAI ELECTRONICS IND.CO.,LTD. |
发明人 |
KIM, MYUNG-SUN;WON, TAE-KYUNG |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|