发明名称 STORAGE ELECTRODE MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 depositing a photoresist(8) for silylatione after forming a MOS transistor, an insulating layer(2) and a polysilicone layer(4) for a storage electrode contacted to a substrate(20); silylation of injecting silicone to the exposed region of the photoresist(8); forming a photoresist pattern(10) in order to roughen the side wall of the photoresist pattern(10) by etching the not-silylated photoresist by generating O2-based plasma; and forming a storage electrode(4) by etching the exposed polysilicone layer(4), and removing the photoresist pattern(10).
申请公布号 KR960015496(B1) 申请公布日期 1996.11.14
申请号 KR19930016592 申请日期 1993.08.25
申请人 HYUNDAI ELECTRONICS IND.CO.,LTD. 发明人 KIM, MYUNG-SUN;WON, TAE-KYUNG
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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