发明名称 METHOD AND APPARATUS FOR MEASURING REFRACTIVE INDEX
摘要 PURPOSE: To measure the refractive index of a substance having unflat surface, e.g. skin, as it is by determining the reflectance of a sample based on the reflective intensity of the micro facet of the sample at a specified azimuth and the shape distribution function. CONSTITUTION: Light is projected to a sample at a different projection angleαand the reflected light for each projection angleαis received at a plurality of different light receiving anglesβ. The angleθ=(α+β) 12 is then determined along with the reflective intensity R (θ,ϕ) of a microfacet at an azimuthϕ. Furthermore, shape distribution function G (ϕ) of the microfacet is determined and then a reflectance F (θ) is determined from the intensity R (θ,ϕ) and the function G (ϕ) according to Fresnel's formula. The reflectance F (θ) thus determined is fitted to Fresnel's formula thus determining the reflectance (n) of the sample. With such arrangement, the refractive index can be measured, as it is, even for an unflat sample, e.g. skin.
申请公布号 JPH08285769(A) 申请公布日期 1996.11.01
申请号 JP19950113989 申请日期 1995.04.15
申请人 KAO CORP 发明人 MINAMI KOJI;KOJIMA NOBUTOSHI;HOTTA HAJIME
分类号 G01N21/41;(IPC1-7):G01N21/41 主分类号 G01N21/41
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