发明名称 |
TREATMENT METHOD, RESIST TREATMENT METHOD AND RESIST TREATMENT DEVICE |
摘要 |
PURPOSE: To integrate a work time in a first treatment part and a second treatment part and unify treatment by providing a pre-standby time for treatment of the second treatment part when there is a difference in a treatment time between both treatment parts. CONSTITUTION: When an exposure treatment part 2 for performing exposure treatment for a wafer and an application/development treatment parts 3 with a heat treatment device for performing post exposure baking treatment for a wafer after exposure treatment are connected through an interface part 4 which delivers a wafer, a pre-standby time inside a heat treatment device is set according to a work time of exposure treatment. |
申请公布号 |
JPH08255750(A) |
申请公布日期 |
1996.10.01 |
申请号 |
JP19960023074 |
申请日期 |
1996.01.16 |
申请人 |
TOKYO ELECTRON LTD;TOKYO ELECTRON KYUSHU KK |
发明人 |
OKAMURA KOJI;AKUMOTO MASAMI |
分类号 |
B08B3/02;G03F7/20;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
B08B3/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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