发明名称 Structure and method for metallization of semiconductor devices
摘要 A metallization alloy for semiconductor devices comprising aluminum, copper, and tungsten is provided. In a method for applying the metallization, the metal is sputtered onto a semiconductor substrate having devices formed therein. After deposition, the metallization is patterned and etched using conventional semiconductor photoresist and etch techniques.
申请公布号 US5554889(A) 申请公布日期 1996.09.10
申请号 US19950430105 申请日期 1995.04.27
申请人 MOTOROLA, INC. 发明人 SHIN, HANK H.;TRACY, CLARENCE J.;DUFFIN, ROBERT L.;FREEMAN, JR., JOHN L.;GRIVNA, GORDON;WILSON, SYD R.
分类号 H01L23/532;(IPC1-7):A01L23/48;A01L23/52;A01L29/40 主分类号 H01L23/532
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