发明名称 INFRARED ANALYTIC METHOD
摘要 <p>PURPOSE: To realize an infrared analysis even for a trace of liquid sample or a liquid sample having a low surface tension or high volatility by making a recess in the surface of an easily moldable plate-shaped window member excellent in light transmissivity, dripping a sample liquid into the recess and then performing the infrared analysis. CONSTITUTION: A recess 2 is made in an easily deformable plate-shaped window material of potassium bromide KBr excellent in light transmissivity and then a liquid sample 5a is dripped therein and analyzed. The recess 2 has an opening of lengths L1, L2 of about 1.0mm and 50μm and the maximum depth of about 30μm. When a sample is subjected to infrared analysis using such window member 1a, an appropriate quantity of the sample 5a is dripped into the recess 2. The sample 5a is contained in the recess 2 while bulging due to surface tension thus providing the film thickness of about 40μm. Since the sample is exposed to the outside, a nonvolatile sample is preferably employed.</p>
申请公布号 JPH08178841(A) 申请公布日期 1996.07.12
申请号 JP19940320902 申请日期 1994.12.22
申请人 SONY CORP 发明人 HATANO HIROKO
分类号 G01N21/35;G01N21/3577;(IPC1-7):G01N21/35 主分类号 G01N21/35
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