| 摘要 |
PURPOSE: To attain low reflectivity to ordinary rays and extraordinary rays at all times by alternately laminating TiO2 films and SiO2 films respectively having specific refractive indices on a double refractive polarizing plate and respectively specifying the film thicknesses and optical film thicknesses of the respective layers. CONSTITUTION: The TiO2 films and the SiO2 films are alternately laminated on the double refractive polarizing plate in such a manner that the first layer and third layer counted from the substrate are the TiO2 films of a refractive index n1 =2.26 and the second layer and fourth layer 4 are the SiO2 films of a refractive index n2 =1.468. The films are so composed that the film thicknesses from the first layer to the fourth layer, respective defined as d1 to d4 , attain d1 =22.8nm, d2 =77.5nm, d3 =22.8nm and d4 =155.1nm and that the optical film thicknesses of the respective layers to rays of a wavelength λ0 =1.55μm, respectively defined as D1 to D4 , attain D1 =n1 d1 /λ0 ≈1/30, D2 =n2 d2 /λ0 ≈11/150, D3 =n1 d3 /λ0 ≈1/30, D4 =n2 d4 /λ0 ≈22/150. The desired low reflectivity to both of the ordinary rays and extraordinary rays is attained by coating a rutile polarizing plate, etc., with such multilayered antireflection films. |
