发明名称 Anordnung zum Testen von fertig bestückten Printplatten, Verfahren zur Herstellung und Testen derselben.
摘要 An improved structure for testing the operability of a completed circuit board having components thereon and improved method of fabricating same are disclosed. The structure and process include the use of an insulator portion with a printed circuit board adhered thereto which includes a testing pattern to evaluate the operability of a completed printed circuit board. The insulator portion which provides support for the test pattern extends past the edge of the printed circuit board thereby providing a remote means] to test the operability of the printed circuit board without having to utilize valuable space and contact points on the printed board itself to test the operability of the completed printed circuit board once components have been installed.
申请公布号 DE69022529(T2) 申请公布日期 1996.05.02
申请号 DE1990622529T 申请日期 1990.10.02
申请人 COMPAQ COMPUTER CORP., HOUSTON, TEX., US 发明人 LUSBY, W. RANDOLPH, KATY, TX 77449, US
分类号 G01R31/28;H01K3/06;H01R12/04;H05K1/02;H05K1/11;H05K3/00;(IPC1-7):G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址