发明名称 Diagnostic wafer
摘要 The wafer (100) includes a placebo wafer (102), several ion current probes (106n) and ion energy analysers (104m), both probes and analysers being mounted on the wafer. At least one extension extends from a circumference of the wafer (110). The ion current probe is coaxially mounted to the analyzer which is itself mounted to the placebo wafer. A collector plate is provided with the analyser and is mounted to the placebo wafer. A discriminator grid annular insulator attached to the plate has a central aperture aligned with a centre of the plate. A discriminator grid spans the central aperture and is spaced apart from the plate. Attached to the grid, a floating grid annular insulator has a central aperture aligned with a central aperture centre of the discriminator insulator. A floating grid attached to floating grid insulator spans the central aperture and is spaced apart from the discriminator grid.
申请公布号 EP0709874(A1) 申请公布日期 1996.05.01
申请号 EP19950117154 申请日期 1995.10.31
申请人 APPLIED MATERIALS, INC. 发明人 LOEWENHARDT, PETER K.;HANAWA, HIROJI;YIN, GERALD ZHEYAO
分类号 H05H1/00;H01J37/32;H01L21/302;H01L21/3065;H01L21/66 主分类号 H05H1/00
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