发明名称 |
Diagnostic wafer |
摘要 |
The wafer (100) includes a placebo wafer (102), several ion current probes (106n) and ion energy analysers (104m), both probes and analysers being mounted on the wafer. At least one extension extends from a circumference of the wafer (110). The ion current probe is coaxially mounted to the analyzer which is itself mounted to the placebo wafer. A collector plate is provided with the analyser and is mounted to the placebo wafer. A discriminator grid annular insulator attached to the plate has a central aperture aligned with a centre of the plate. A discriminator grid spans the central aperture and is spaced apart from the plate. Attached to the grid, a floating grid annular insulator has a central aperture aligned with a central aperture centre of the discriminator insulator. A floating grid attached to floating grid insulator spans the central aperture and is spaced apart from the discriminator grid. |
申请公布号 |
EP0709874(A1) |
申请公布日期 |
1996.05.01 |
申请号 |
EP19950117154 |
申请日期 |
1995.10.31 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
LOEWENHARDT, PETER K.;HANAWA, HIROJI;YIN, GERALD ZHEYAO |
分类号 |
H05H1/00;H01J37/32;H01L21/302;H01L21/3065;H01L21/66 |
主分类号 |
H05H1/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|