发明名称 METHOD FOR AUTOMATICALLY MEASURING RIN CHARACTERISTIC OF LASER DIODE
摘要 PURPOSE: To make it possible to perform automatic measurement, to output the result instantly and to improve the efficiency of measurement/inspection works by reading the data from the circuits of two systems with a CPU, and performing the control and operation. CONSTITUTION: When a Sys.Noise push-button switch 13 is operated under the state wherein an optical input signal 10 is not inputted, the residual noise of a system is digitized with an A/D converter-II 9. Thus, the system residual noise Nz is obtained. Furthermore, a Graph push-button switch 14 is operated under the state wherein the signal 10 is inputted. When the switch 14 is operated, the output 2b from an A/D converter-I 4 and the output Nm from the converter-II 9 are read with a CPU 11, and Pm is obtained. Then, the output from the converter-I 4 is read with the CPU 11, and the average optical power Po is obtained. Therefore, the operation is performed with the CPU 11, and RIN=10log(Pm/Po)<2> is obtained. A display device 12 can instantly display the result of the automatic measurement on, e.g. a CRT.
申请公布号 JPH08110283(A) 申请公布日期 1996.04.30
申请号 JP19930257623 申请日期 1993.09.21
申请人 ADVANTEST CORP 发明人 MORI HIROSHI;BENDOU MASATOSHI
分类号 G01M11/00;G01R31/26;H01L21/66;H01S3/101;H04B10/07;H04B10/079 主分类号 G01M11/00
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