Abnormal pattern detecting or judging apparatus, circular pattern judging apparatus, and image finding apparatus

摘要

An abnormal pattern detecting apparatus comprises a device for finding prospective abnormal patterns in a radiation image of an object from an image signal representing the radiation image, and a device for finding anatomical information about the object from the image signal. From the image signal components of the image signal, which represent the image information at positions in the vicinity of each prospective abnormal pattern, a characteristic measure calculating device calculates a plurality of characteristic measures for each prospective abnormal pattern. An abnormal pattern finding device utilizes the characteristic measures and the anatomical information in order to find a true abnormal pattern from the prospective abnormal patterns.