发明名称 INTEGRATED CIRCUIT MANUFACTURING PROCESS
摘要 In the manufacturer of integrated circuits, an undope d wide band-gap semiconductor is used for the insulating layer to isolate the silicon substrate from the metal interconnection pattern. To provide vias through the insulating layer for connection to the source and drain of the transistors of the circuit, the wide band-gap semiconductor is implanted with a dopant selectively in the portion overlying the source and drain for making the implanted portion of low resistivity and of the conductivity type of the source and drain. Preferably, carbon is the wide band-gap semiconductor and nitrogen is the dopant implanted. This invention relates to the fabrication of integrated circuit devices.
申请公布号 KR960004589(B1) 申请公布日期 1996.04.09
申请号 KR19870011470 申请日期 1987.10.16
申请人 SGS-THOMSON MICROELECTRONICS IND. 发明人 MILLER, ROBERT O.
分类号 H01L23/52;H01L21/314;H01L21/3205;H01L21/768;(IPC1-7):H01L21/00;H01L21/263 主分类号 H01L23/52
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