发明名称
摘要 <p>PURPOSE:To execute simultaneous and quick continuity and short-circuit testing in X- and Y directions by providing pads for making the continuity and non- continuity tests to respective terminals of both of the X-direction wirings and Y-direction wirings. CONSTITUTION:The X-direction wirings 1 and the Y-direction wirings 2 are constituted similarly to the conventional matrix display device in a display region 3 but both terminals of the wirings 1, 2 are extended up to the inside of a scribed region 4 and are provided with the pads P and P' for the continuity test. The continuity test is carried out by moving probe needles N and N' over the scribing region 4 having a certain parallel positional relation with the pads P and P' in contact therewith. On the other hand, the non-continuity test is executed by moving the probe needles in such a manner that the probe needle N' contacts the pad P' next to or before the corresponding pad when the probe needle N contacts the pad P. The grazed scribing region 4 is removed after the test.</p>
申请公布号 JPH0830820(B2) 申请公布日期 1996.03.27
申请号 JP19860049767 申请日期 1986.03.07
申请人 SEIKO INSTR & ELECTRONICS 发明人 ARAI SATOSHI
分类号 G09F9/30;G01R31/02;G02F1/133;G02F1/1343;G02F1/136;G02F1/1368;(IPC1-7):G02F1/136;G02F1/134 主分类号 G09F9/30
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