| 摘要 |
<p>PURPOSE: To provide an information processing equipment which prevents malfunction due to internal temperature rise of a semiconductor integrated circuit, without interrupting the function of an equipment, and can operate at a speed as high as possible. CONSTITUTION: Temperature sensors 31, 32 and 33 for detecting internal temperatures are built in semiconductor integrated circuits 21, 22 and 23, respectively. A selector 7 selects either one of the output clock signals f2 and fa from clock signal generators 5 and 6, according to the output control signal (a) of an NAND gate 4. The semiconductor integrated circuits 21, 22, 23 normally operate on the basis of a clock signal whose frequency f2 is higher than the usual clock frequency, when the internal temperatures are lower than or equal to the respective operation guarantee temperatures. As the result, high speed processing operation is realized as compared with the conventional case. When the internal temperature exceeds the operation guarantee temperature Tmax, the selector 7 selects a second clock signal whose frequency is fa, and the operation speed is decreased as compared with the usual case.</p> |
