发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 <p>PURPOSE: To compare ROM data in a specific continuous address area of a ROM with expected value data and to output the result showing whether or not data in all the addresses are coincident to the outside when the ROM contents are tested without being outputted to the outside while the data are kept secret. CONSTITUTION: This circuit is equipped with the ROM 2 and circuits 15, 16, and 17 which decide whether or not the ROM data read out in a data bus 13 corresponding to an external address input matches the expected value data inputted to an address bus 14 in synchronism with the external address signal by comparing them with each other and also decide whether or not the address signal specifying a specific number of continuous addresses of the ROM in order is inputted in sequence from outside, and then decide whether the ROM data read out in order corresponding to the continuous address input all matches the corresponding sequentially inputted expected value data on the basis of these decision results.</p>
申请公布号 JPH0863402(A) 申请公布日期 1996.03.08
申请号 JP19940198585 申请日期 1994.08.23
申请人 TOSHIBA CORP 发明人 FUKUOKA HIROSHI
分类号 G06F12/14;G06F12/16;G06F15/78;G06F21/24;G11C17/00;G11C29/00;G11C29/12;(IPC1-7):G06F12/16 主分类号 G06F12/14
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