发明名称 TEST SYSTEM FOR IMAGE PICKUP DEVICE MOUNTED ON SPIN SATELLITE
摘要 PURPOSE:To evaluate consecutive two-dimension images focused to an infinite remote point, to easily conduct the test simulating a wide visual field equivalent to one rotation of a spin satellite and to evaluate the image pickup device transferring data at a high speed. CONSTITUTION:The system is provided with a spin table 1 rotated at a spin rate of a spin satellite, a cylindrical simulated object 2 mounted on the spin table 1 in a way that its center axis is in matching with a center axis of the spin table 1 whose side face is drawn with an image evaluation test chart 3, a correction lens system 4 correcting the image of a side line closest to an image pickup device 5 of the cylindrical simulated object 2 so as to be an infinite remote point of the image pickup device 5, and the image pickup device 5 picking up the image of the side line of the cylindrical system simulated object 2 incorporating a linear sensor 5b and rotated on the spin table via the correction lens system 4.
申请公布号 JPH07274218(A) 申请公布日期 1995.10.20
申请号 JP19940084121 申请日期 1994.03.30
申请人 NEC CORP 发明人 OSHIMA TAKESHI
分类号 H04N5/225;H04B7/185;H04N17/00;(IPC1-7):H04N17/00 主分类号 H04N5/225
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