发明名称 ALLOY ELECTRODE AND SEMICONDUCTOR USING THE ALLOY ELECTRODE, AND MANUFACTURE OF ALLOY ELECTRODE
摘要 PURPOSE:To provide an alloy electrode which helps to decrease a defective rate of bonding and to provide a semiconductor device wherein the alloy electrode is used and to provide a method for making the alloy electrode. CONSTITUTION:An alloy electrode to be used for bonding is manufactured by depositing an Al-Si film 13 on a layer insulating film 12 formed on an Si substrate 11 and then conducting a heat treatment. On the layer insulating film 12, Si fine particles 13a of 0.5mum or above in diameter are deposited at the density of 150/900mum<2> but only the ones that have the diameter of 2.8mum or below are left behind on the film. This is achieved by setting a substrate temperature at the formation of the Al-Si film 13 and a heat-treatment temperature in the following process to specific ones. By this method, cracks are prevented from appearing in the layer insulating film 12 under the Al-Si film 13 and causing a bad insulation at the time of wire bonding.
申请公布号 JPH07240432(A) 申请公布日期 1995.09.12
申请号 JP19940006270 申请日期 1994.01.25
申请人 NIPPONDENSO CO LTD 发明人 NORITAKE CHIKAGE;KONDO ICHIJI;WATANABE TAKESHI;INAGUMA YOSHIAKI
分类号 H01L21/28;H01L21/321;H01L21/60;H01L29/78 主分类号 H01L21/28
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