发明名称 |
ALLOY ELECTRODE AND SEMICONDUCTOR USING THE ALLOY ELECTRODE, AND MANUFACTURE OF ALLOY ELECTRODE |
摘要 |
PURPOSE:To provide an alloy electrode which helps to decrease a defective rate of bonding and to provide a semiconductor device wherein the alloy electrode is used and to provide a method for making the alloy electrode. CONSTITUTION:An alloy electrode to be used for bonding is manufactured by depositing an Al-Si film 13 on a layer insulating film 12 formed on an Si substrate 11 and then conducting a heat treatment. On the layer insulating film 12, Si fine particles 13a of 0.5mum or above in diameter are deposited at the density of 150/900mum<2> but only the ones that have the diameter of 2.8mum or below are left behind on the film. This is achieved by setting a substrate temperature at the formation of the Al-Si film 13 and a heat-treatment temperature in the following process to specific ones. By this method, cracks are prevented from appearing in the layer insulating film 12 under the Al-Si film 13 and causing a bad insulation at the time of wire bonding. |
申请公布号 |
JPH07240432(A) |
申请公布日期 |
1995.09.12 |
申请号 |
JP19940006270 |
申请日期 |
1994.01.25 |
申请人 |
NIPPONDENSO CO LTD |
发明人 |
NORITAKE CHIKAGE;KONDO ICHIJI;WATANABE TAKESHI;INAGUMA YOSHIAKI |
分类号 |
H01L21/28;H01L21/321;H01L21/60;H01L29/78 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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