发明名称 Method for metallizing a semiconductor wafer
摘要 A method for metallizing semiconductor materials includes two processing steps. In the first step, a layer of an alloy of conductive metal, such as aluminum, and refractory metal, such as titanium, tungsten or silicon, is deposited on the surface in a single step from a single source. In the second step, a layer of the conductive metal is deposited over the alloy layer. Thus, using this method, metallization can be conveniently performed using two chambers.
申请公布号 US5443995(A) 申请公布日期 1995.08.22
申请号 US19930122851 申请日期 1993.09.17
申请人 APPLIED MATERIALS, INC. 发明人 NULMAN, JAIM
分类号 H01L21/768;H01L23/532;(IPC1-7):H01L21/44;H01L21/48 主分类号 H01L21/768
代理机构 代理人
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