Two-transistor dynamic random-access memory cell having a common read/write terminal

摘要

A two transistor dynamic random access memory can be treated as a pair of voltage controlled elements which are reversibly controlled in a three step process. In the first step, a capacitance is charged on the controlling terminal of memory transistor. The second step entails isolating the charge on the capacitance of the controlling terminal. The third step entails providing a reversibly controlled voltage on the controlling terminal to further control the two memory transistors without altering the charge of the capacitance. This allows a non-destructive reading of the output of the stored information signal.