发明名称 Verbindungsstruktur zum Verbinden von Leitern in einem elektronischen Apparat.
摘要 A connecting structure for connecting conductors used for wiring in a semiconductor device (100) comprises a first conductor (10) provided on a part of the semiconductor device for passing the flow of electrons, an insulator (12) provided on the first conductor and formed with a contact hole (13), and a second conductor (11) provided on the insulator for passing the flow of electrons, in which the second conductor is provided so as to sandwich the insulator together with a part of the first conductor. The first and second conductors are contacted to each other across the insulator at the contact hole so that the electrons flow through the contact hole. The contact hole extends in a general direction of a flow of electrons passing therethrough and has a stepped shape in which a width measured perpendicularly to the general direction of the flow of electrons increases stepwise towards the general direction of the flow of electrons.
申请公布号 DE68922767(D1) 申请公布日期 1995.06.29
申请号 DE1989622767 申请日期 1989.03.15
申请人 FUJITSU LTD., KAWASAKI, KANAGAWA, JP;FUJITSU VLSI LTD., KASUGAI, AICHI, JP 发明人 TANAKA, NOBUYUKI, KUWANA-SHI MIE, 591, JP;SAITOH, TAICHI, YOKOHAMA-SHI KANAGAWA, 227, JP;KISO, AKIO, KAWASAKI-SHI KANAGAWA, 211, JP;TOKUDA, HIDEO, KAWASAKI-SHI KANAGAWA, 214, JP;NAKAJIMA, TETSUYA, YOKOHAMA-SHI KANAGAWA, 241, JP;TAKAGI, MINORU, KASUGAI-SHI AICHI, 487, JP
分类号 H01L23/482;(IPC1-7):H01L23/48;H01L23/52 主分类号 H01L23/482
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