发明名称 PHASE SHIFT MASK
摘要 <p>PURPOSE:To enable the transfer of desired patterns at desired pattern widths and decreased stages with a phase shift mask of a chromium-less system. CONSTITUTION:At least a part of the edges of phase shifters 3 consisting of a transparent material formed on a transparent substrate 1 are provided with dummy pattern edges 4 formed of a part of the phase shifters 3 so as to exist along the edges. The patterns in the edge parts of the phase shifters 3 are erased or the pattern width is made finer by changing the intervals of the edges of the dummy patterns 4 and the phaseg shifters, by which the exposing stage is simplified and the degree of freedom of pattern formation is enhanced.</p>
申请公布号 JPH07152144(A) 申请公布日期 1995.06.16
申请号 JP19930323337 申请日期 1993.11.30
申请人 NEC CORP 发明人 YASUSATO TADAO
分类号 G03F1/34;G03F1/36;G03F1/68;H01L21/027;(IPC1-7):G03F1/08 主分类号 G03F1/34
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