| 摘要 |
<p>PURPOSE:To provide a circuit to diagnose the abnormality of the IC detector of an IC carrier mechanism. CONSTITUTION:A supplying rail 1 allows plural ICs 10 to stand by continuously. The IC 10 is transferred separately from the supplying rail 1 to a reciprocating rail 2, and the IC 10 on the reciprocating rail 2 is transferred to a Receiving rail 3. A projector 4A emits light to pass through the detecting hole 2A of the reciprocating rail 2, and a light receiver 4B receives the light of the projector 4A. The IC detector 4C detects the presence of the IC 10. When the reciprocating rail 2 receives the IC 10 and moves, a latch signal 51 is sent to a control part 6 while considering a point at which the light receiving output of the light receiver 4B is generated to be latch timing. When the reciprocating rail 2 returns and receives the following IC 10, the latch signal is confirmed at the point at which the receiving output of the light receiver 4B is turned off, and the abnormality of the IC detector is diagnosed.</p> |
