发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 <p>PURPOSE:To accurately monitor an internal step-down power source level in a semiconductor integrated circuit using an internal step-down power source. CONSTITUTION:A semiconductor integrated circuit using an internal step-down power source has a circuit which compares an internal step-down power source level (VINT) with external signal input and a comparator, a test circuit buffer which propagates the compared result, and an output circuit which outputs data to an external output terminal, and these circuits are driven with an external power source (VCC), widen a power source margin, and ensure circuit operation independent of the VINT level. Accurate monitor of VINT before VINT adjusting can be expected. These circuits are also activated with a test mode signal.</p>
申请公布号 JPH07140208(A) 申请公布日期 1995.06.02
申请号 JP19930309669 申请日期 1993.11.17
申请人 NEC CORP 发明人 NAKAYAMA HIROSHI
分类号 G01R31/28;G01R31/30;G05F1/46;G11C16/06;G11C29/00;G11C29/02;G11C29/12;G11C29/50;H01L21/66;H03F3/30;(IPC1-7):G01R31/28 主分类号 G01R31/28
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