发明名称 Circuit integrity tester
摘要 {PG,1 The test device is an electrolytic apparatus for the simultaneous non-destructive testing of the integrity of pluralities of circuit boards for continuity and anti-continuity or short circuits, including such circuit boards as employ multi-layer or multi-level interconnection wiring, whether it be printed wiring or screen printed or thermally deposited circuits. Transient electro-deposition of one ion from an alkali halide water solution temporarily modifies the optical reflectivity of exposed circuit terminals or metal parts of the circuit boards under test in a characteristic and easily recognized manner according to the continuity status of the associated circuit paths.
申请公布号 US4165270(A) 申请公布日期 1979.08.21
申请号 US19780942099 申请日期 1978.09.13
申请人 SPERRY RAND CORPORATION 发明人 OST, ROBERT J.;PERRY, ROBERT F.
分类号 G01R31/02;G01R31/28;(IPC1-7):G01N27/00;G01R31/08 主分类号 G01R31/02
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