| 摘要 |
A wavelength meter (10) for measuring the wavelength of laser light includes a diffraction element (52) for diffracting the light and a glass plate interferometer (60) in light communication with the diffraction element (52) for generating a sinusoidally-shaped interference fringe pattern (98). The interference fringe pattern (98) is detected by a CCD array (100) which sends a signal representative of the fringe pattern (98) to a computer (140). The computer (140) filters and analyzes the signal, and corrects the signal for temperature-induced changes in the optical path of the laser light beam. The computer (140) compares the signal with a prestored signal representing a predetermined fringe pattern using a least-squares fit analysis, and from this analysis determines the wavelength of the laser light. An alignment assembly is provided for facilitating directing laser light through the aperture of the diffraction element.
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