| 摘要 |
A semiconductor device is disclosed which is directed to drastically reduce a conduction test time by reliably executing the conduction test of all terminals in a lump. The invention discloses the semiconductor device including a first power supply terminal, a second power supply terminal having a lower potential than the first power supply terminal, an internal circuit portion to which the first and second power supply terminals are connected, and an input signal terminal group and an output signal terminal group each connected to the internal circuit portion, wherein a first voltage supply source and a second voltage supply source having a predetermined potential difference from the first voltage supply source are disposed, a switching device is interposed between the first and second voltage supply sources, and the switching device is turned ON and OFF in accordance with the existence of a voltage applied to each of the terminals described above.
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