发明名称 Dry etching method
摘要 A method may be used to dry etch a sample including a plurality of regions different from each other in the photo-absorption of a light having a specified wavelength using an etching gas plasma. The method is capable of selectively etching the desired material from a plurality of materials having different types of band gap energies or from a plurality of materials having different band gap energies. The method includes a step of irradiating a light having the specified wavelength on the sample for reducing an etching rate of a region having a large photo-absorption coefficient to the light, thereby selectively etching a region having a small photo-absorption coefficient to the light.
申请公布号 US5401357(A) 申请公布日期 1995.03.28
申请号 US19920937781 申请日期 1992.09.01
申请人 HITACHI, LTD. 发明人 OKUHIRA, HIDEKAZU;ONO, TETSUO;HIRAOKA, SUSUMU;SUZUKI, KEIZO;SHIGETA, JUNJI;MASUDA, HIROSHI;MORI, MITSUHIRO;TANIMOTO, TAKUMA;NAKATSUKA, SHINICHI;MITANI, KATSUHIKO
分类号 H01L21/205;H01L21/285;H01L21/302;H01L21/306;H01L21/3065;H01L21/308;H01L21/316;H01L21/331;H01L21/335;H01L21/338;H01L29/205;H01L29/73;H01L29/737;H01L29/778;H01L29/812;(IPC1-7):H01L21/306;B44C1/22 主分类号 H01L21/205
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