发明名称 Liquid epitaxial process for producing three-dimensional semiconductor structures
摘要 By a liquid epitaxial process monocrystalline semiconductor layers are produced having a high degree of crystal perfection in a multi-layer arrangement on intermediate layers of an insulating material and/or carbone and/or metal, in order to produce three-dimensional semiconductor structures which offer low mechanical stresses and load-bearing densities of between 1014 and 1021 per cm3. Very low manufacturing temperatures can be used, for example between 300 DEG and 900 DEG C. The seeding for each epitaxial layer is performed in the openings of the intermediate layer where a monocrystalline material is located in a free state. From these openings, the lateral and monocrystalline growth of the intermediate layers takes place. The repeated application of the liquid epitaxial process described allows three-dimensional integration in monocrystalline multilayer structures which are extremely devoid of defects.
申请公布号 US5397736(A) 申请公布日期 1995.03.14
申请号 US19940262227 申请日期 1994.06.20
申请人 MAX-PLANCK-GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN 发明人 BAUSER, ELISABETH;STRUNK, HORST PAUL
分类号 H01L21/20;H01L21/208;H01L21/822;(IPC1-7):H01L21/20;H01L21/82;C30B19/00 主分类号 H01L21/20
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