PROCESS OF TAKING DEFECTOGRAMS UNDER RADIOGRAPHIC OR X-RAY TESTING OF WELDS,申请号SU19915004274-传众专利搜索

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发明名称	PROCESS OF TAKING DEFECTOGRAMS UNDER RADIOGRAPHIC OR X-RAY TESTING OF WELDS
摘要
申请公布号	RU2030735(C1)	申请公布日期	1995.03.10
申请号	SU19915004274	申请日期	1991.07.02
申请人	ARENDNAYA ORGANIZATSIYA - NAUCHNO-ISSLEDOVATELSKIJ I PROEKTNYJ INSTITUT KHIMIKO-FOTOGRAFICHESKOJ PROMYSHLENNOSTI	发明人	PETROV VLADIMIR P;KARPENKO GALINA V;SAVVIN NIKOLAJ I;KARTSEVA GALINA G;SHUBERT GEORGIJ N;RYABOV VALERIJ P
分类号	G01N23/02;(IPC1-7):G01N23/02	主分类号	G01N23/02
代理机构		代理人
主权项
地址

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