| 摘要 |
PURPOSE:To analyze various elements accurately by forming a foil surface more similar to a mirror surface with the increase of the opening angle of a solar slit and to a rough surface with the decrease of the opening angle. CONSTITUTION:Since the parallelism of passing fluorescent X-rays B2 is augmented because the spaces Da of foils 24 are reduced in solar slits 21 and X-rays B2 are not totally reflected on the surfaces of the foils 24 because the surfaces of the foils 24 are formed in rough surfaces, X-rays B2 having extremely excellent parallelism are introduced to a spectroscope, thus keeping an angle of incidence to a spectral element constant, then acquiring light having the remarkably narrow wavelength range of diffraction X-rays, monochromatic light. When an extra-light element is measured, on the other hand, the intensity of passing X-rays B2 is increased and the surfaces of the foils 24 are formed to be more similar to mirror surfaces because the spaces Dc of the foils 24 of solar slits 23 are augmented, thus also directing X-rays B2 totally reflected on the surfaces of the foils 24 toward the spectroscope. Accordingly, even the extra-light element can be detected by an X-ray detector because the intensity of X-rays B2 toward the spectroscope is increased remarkably. |
