发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PURPOSE:To reduce the number of test use signal lines by applying bus- connection of the test use signal lines to a function block. CONSTITUTION:A block terminal circuit 120 is classified into a block input terminal circuit 121, a block output terminal circuit 122 and a block input output terminal circuit 123 depending on the direction and contents of the signal. When a concerned block is designated to the normal mode through a test mode control block, signals from each of function blocks 101-103 are received/outputted through signal lines 136, 137, an input signal line group 132 and an output signal line group 133 between blocks, and when the block is designated to be a test object in the test mode, signals are received/outputted through a test input bus 134 and a test output bus 135. When the block is designated to a test non- object in the test mode, an input signal to the function block and an output signal from the function block are converted into fixed signals with an inactive level.
申请公布号 JPH0744415(A) 申请公布日期 1995.02.14
申请号 JP19930184110 申请日期 1993.07.26
申请人 NEC CORP 发明人 YAMAHATA HITOSHI
分类号 G06F11/22;G11C11/401;G11C29/02;H01L21/66;H01L21/82;H01L21/822;H01L27/04;H01L27/10 主分类号 G06F11/22
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