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发明名称
TESTING DEVICE FOR LOGIC CIRCUIT
摘要
申请公布号
JPH0727824(A)
申请公布日期
1995.01.31
申请号
JP19930174029
申请日期
1993.07.14
申请人
SEIKO EPSON CORP
发明人
SAKURAI TOMOO
分类号
G01R31/28;(IPC1-7):G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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