发明名称 Process and apparatus for the measurement of object topographies by means of projected fringe patterns
摘要 In a process and apparatus for measuring object topographies by means of projected fringe patterns, to enlarge the region of certainty, different periodicities are evaluated. Calibration of the measurement apparatus is carried out in at least two parallel planes, situated in the forward and in the rearward regions of the measurement volume. Corrected phase values are first calculated from the phase measurement values of the measurement object. By combination of the phase measurement values relating to the pattern of long periodicity and of the pattern of short periodicity, the fringe order of the phase values relating to short periodicity is calculated. By interpolation of the correction values between the two planes in which the reference measurements were carried out, the measurement process and a corresponding measurment apparatus provide highly accurate measurement values, with simultaneously reduced requirements on the accuracy of mechanical and/or optical adjustment.
申请公布号 US5379107(A) 申请公布日期 1995.01.03
申请号 US19930063175 申请日期 1993.05.14
申请人 CARL-ZEISS-STIFTUNG 发明人 HANSSEN, ADALBERT;HOF, ALBRECHT
分类号 G01B11/25;G01C11/02;(IPC1-7):G01B11/24 主分类号 G01B11/25
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