Apparatus and method for measuring thickness of thin semiconductor multi-layer film.

摘要

The film interference waveform of a wavenumber dispersion (wavelength dispersion) spectrum of the reflected light is obtained from numerical calculation using an optical characteristic matrix by a theoretical interference spectrum calculating means with respective film thickness measured values of a semiconductor device obtained from waveform analysis of the spatial interference waveform as initial values, these calculated values are subjected to waveform fitting with actually measured values by recalculating means, and the theoretical interference spectrum is recalculated while changing the approximate values of the film thicknesses intentionally, whereby high precision respective film thicknesses are obtained. The film thicknesses of respective layers of a thin multi-layer film in submicron can be non-destructively measured exactly and stably with no contact. <IMAGE>