APPARATUS AND METHOD FOR INSERTION AND EXTRACTION OF SEMICONDUCTOR

摘要

PURPOSE:To decrease a contact failure caused by a foreign body between an IC lead and an IC socket in an electrical characteristic test of an IC chip. CONSTITUTION:A test board (2 or 14) is arranged in an IC insertion and extraction machine with its front surface down and a part for IC insertion of an IC socket is directed in vertical direction. Under this condition, an IC 3 is inserted into the IC socket. As inserted parts of the IC leads are directed in vertical direction, a foreign substance can be removed easily and also it is hard to stick.