发明名称 METHOD AND DEVICE OF SILICON FUSION BONDING
摘要 To increase the bonding strength and to remove the micro-gaps incured at bonding two sillicon wafers, the silicon fusion bonding method and equipment were developed. The equipment is composed of a wet oxidation equipment and a quartz spacer separating two wafers (w1,w2). The wafers are bonded by filling the micro-gaps located at junction interface with the wet oxide through the high temperature thermal annealing, which is followed by the stabilization process absorbing a great deal of oxidant. This method can be applied to growing a silicon on an insulation film and forming the micromachine structure for silicon sensors
申请公布号 KR940010493(B1) 申请公布日期 1994.10.24
申请号 KR19910020836 申请日期 1991.11.21
申请人 KIST 发明人 JU, BYONG - KWON;OH, MYONG - HWAN;KANG, KWANG - NAM
分类号 H01L21/02;H01L21/00;H01L21/18;H01L21/316;(IPC1-7):H01L21/30 主分类号 H01L21/02
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