发明名称 |
METHOD AND DEVICE OF SILICON FUSION BONDING |
摘要 |
To increase the bonding strength and to remove the micro-gaps incured at bonding two sillicon wafers, the silicon fusion bonding method and equipment were developed. The equipment is composed of a wet oxidation equipment and a quartz spacer separating two wafers (w1,w2). The wafers are bonded by filling the micro-gaps located at junction interface with the wet oxide through the high temperature thermal annealing, which is followed by the stabilization process absorbing a great deal of oxidant. This method can be applied to growing a silicon on an insulation film and forming the micromachine structure for silicon sensors
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申请公布号 |
KR940010493(B1) |
申请公布日期 |
1994.10.24 |
申请号 |
KR19910020836 |
申请日期 |
1991.11.21 |
申请人 |
KIST |
发明人 |
JU, BYONG - KWON;OH, MYONG - HWAN;KANG, KWANG - NAM |
分类号 |
H01L21/02;H01L21/00;H01L21/18;H01L21/316;(IPC1-7):H01L21/30 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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