发明名称 MANUFACTURING METHOD OF MASK ROM MOS-TR
摘要 forming a polysilicon layer on a gate oxide layer formed on a substrate; forming a tungsten silicide layer on the polysilicon layer to form a gate electrode, the polysilicon layer of the gate electrode not being connected to a contact portion contact with a semiconductor layer in another region.
申请公布号 KR940009629(B1) 申请公布日期 1994.10.15
申请号 KR19910020420 申请日期 1991.11.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SE - JIN;YU, YONG - KYUN;CHOE, U - SHIK;KIM, HYONG - BOK
分类号 H01L27/04;H01L27/112;(IPC1-7):H01L27/112 主分类号 H01L27/04
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