发明名称 POLY SILICON RESISTANCE
摘要 The method for fabricating a polysilicon resistor is disclosed in which polysilicon and CVD nitride are sequentially deposited on a field oxide layer, and heat-treated under the ambient of nitrogen at a high temperature, to form an isolation region and a n+ heavily doped collector, thereby growing the grain size of the polysilicon.
申请公布号 KR940008884(B1) 申请公布日期 1994.09.28
申请号 KR19920010947 申请日期 1992.06.23
申请人 SAMSUNG ELECTONICS CO., LTD. 发明人 KO, JANG - MAN;LEE, KYONG - HO
分类号 H01C7/00;(IPC1-7):H01C7/00 主分类号 H01C7/00
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