发明名称 SHAPE EXAMINATION DEVICE
摘要 PURPOSE:To examine an irregular shape of a face to be examined properly by providing a data correction part, which corrects a detected level in a position detector to the height upper limit value when the detected level of the position detector is the minimum fixed value or less and the like. CONSTITUTION:A data processing part 11 A/D converts an output signal from a position detector 9 into the data concerning the height of the examined position. A quantity of light determining part 12 determines whether a detected level of a quantity of light detector 10 is lower than the predetermined minimum value or not and outputs a correction requiring signal when the detected level is lower than the predetermined minimum value. A data correction part 13 corrects the data from the processing part 11 to the predetermined height lower limit value when the correction requiring signal is outputted from the determining part 12. Also in the data correction part 13, the data from the processing part. 11 is corrected to the predetermined height upper limit value, when the detected level of the detector 9 is lower than the predetermined minimum value even though no correction requiring signal is outputted. A quality determining part 19 operates the error between a detected data corresponding to an examination area and a reference data of a reference data memory 17, and compares the error to the threshold value from a threshold value memory 18, so that it is determined whether a mounting condition is good or not.
申请公布号 JPH06213631(A) 申请公布日期 1994.08.05
申请号 JP19930004714 申请日期 1993.01.14
申请人 TAIYO YUDEN CO LTD 发明人 TANAKA KAZUYUKI
分类号 G01B11/24;G01N21/88;G01N21/93;G01N21/956;G06T1/00 主分类号 G01B11/24
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