| 摘要 |
<p>A process for reducing the test requirements of memory devices once they are packaged into modules by using a unique identification of a memory device based on the locations or types and locations of some of the defects in that memory device. The unique identification is used as an index to access a database containing more information on the types and locations of defects within that memory device. The information is then stored in a non-volatile memory on the module containing that memory device.</p> |
