发明名称 |
A MOS TRANSISTOR HAVING A COMPOSITE GATE ELECTRODE AND METHOD OF FABRICATION |
摘要 |
A novel, reliable, high performance MOS transistor (300) with a composite gate electrode which is compatible with standard CMOS fabrication processes. The composite gate electrode comprises a polysilicon layer (302) formed on a highly conductive layer (304). The composite gate electrode is formed on a gate insulating layer (301) which is formed on a silicon substrate (308). A pair of source/drain regions (310a, 310b) are formed in the substrate and are self-aligned to the outside edges of the composite gate electrode. |
申请公布号 |
WO9414198(A1) |
申请公布日期 |
1994.06.23 |
申请号 |
WO1993US11116 |
申请日期 |
1993.11.16 |
申请人 |
INTEL CORPORATION |
发明人 |
CHAU, ROBERT, S.;FRASER, DAVID, B.;CADIEN, KENNETH, C.;RAGHAVAN, GOPAL;YAU, LEOPOLDO, D. |
分类号 |
H01L29/43;H01L21/28;H01L21/336;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L29/76;H01L23/48;H01L23/52;H01L29/40;H01L29/94 |
主分类号 |
H01L29/43 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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