发明名称 |
Electrode for use in plasma etching. |
摘要 |
The present invention provides an electrode for use in plasma etching, composed of a silicon single crystal or a silicon single crystal having a large number of small through-holes. The electrode of the present invention is free from structural destruction, resultantly has a long life, and causes no staining of wafer surface owing to structural destruction. Further, when the electrode has an appropriate number of small through-holes, a reactant gas can flow into a plasma smoothly and enables more efficient plasma etching. |
申请公布号 |
EP0600365(A1) |
申请公布日期 |
1994.06.08 |
申请号 |
EP19930118926 |
申请日期 |
1993.11.24 |
申请人 |
NISSHINBO INDUSTRIES, INC. |
发明人 |
SAITO, KAZUO, C/O NISSHINBO INDUSTRIES, INC.;ISHIMATSU, TAKESHI, C/O NISSHINBO INDUSTRIES, INC. |
分类号 |
C23F4/00;H01J37/32;H01L21/302;H05H1/34 |
主分类号 |
C23F4/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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